The TTRAX incorporates both Cross Beam Optical technology (CBO) and an independent in-plane scattering axis to provide the widest possible range of measurement geometries without the need for system reconfiguration.
Experimental capabilities include standard powder diffraction, glancing incidence diffraction, in-plane diffraction, high resolution diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS). The TTRAX III can be configured with a wide range of optional attachments for maximum flexibility.
TTRAX III Features: