TETRA 17 Contact AFM Probe

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TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology

The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability.

Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is unmatched in its versatility. Accompanied by its bargain pricing and complementary Au tip coating, the TETRA series provides its users with the quality they seek at a price they can afford.

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