TETRA 17 Contact AFM Probe

TETRA 17 Contact AFM Probe
by K-TEK Nanotechnology


TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is unmatched in its versatility. Accompanied by its bargain pricing and...read more

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Description

 

TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology

The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability.

Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is unmatched in its versatility. Accompanied by its bargain pricing and complementary Au tip coating, the TETRA series provides its users with the quality they seek at a price they can afford.

Product Overview

TETRA 17 Contact AFM Probe by K-TEK Nanotechnology
TETRA 17 Contact AFM Probe

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