TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology

The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability.

Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip coating, the TETRA series provides its users with the quality they seek at a price they can afford.