SUPRA™ Ultra-high resolution FESEM models

Manufacturer ZEISS Microscopy


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The new SUPRA™ series, based on the 3rd generation GEMINI® column, offers a complete range of ultra high resolution FESEMs models to cover all fields of applications in nano technology, cryo, nano structural materials analysis and semiconductor development and failure analysis.
The key advantages of the GEMINI® FESEM column are superb resolution down to 0.1kV, high efficiency. The SUPRA's unique variable pressure (VP) capability enables examination of non-conducting specimens without time consuming preparation.

Products
SUPRA™ 25
SUPRA™ 40
SUPRA™ 40VP
SUPRA™ 55
SUPRA™ 55VP
SUPRA™ 60
SUPRA™ 60VP

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SUPRA™ Ultra-high resolution FESEM models

Manufacturer ZEISS Microscopy

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