SolidSpec-3700 by Shimadzu Europa GmbH
Manufacturer Shimadzu Europa GmbH
High Sensitivity The SolidSpec 3700/ 3700DUV is designed for the highest sensitivity. It is the first UV-VIS-NIR spectrophotometer with three detectors: a photomultiplier tube (PMT) detector for the ultraviolet and visible region, and furthermore InGaAs and PbS detectors for the near-infrared region. The use of the InGaAs and PbS detectors makes the sensitivity in the near-infrared region extremely high. Up to now, all conventional spectrophotometers have used a photomultiplier tube detector for... Read more
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SolidSpec-3700
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High Sensitivity
The SolidSpec 3700/ 3700DUV is designed for the highest sensitivity. It is the first UV-VIS-NIR spectrophotometer with three detectors: a photomultiplier tube (PMT) detector for the ultraviolet and visible region, and furthermore InGaAs and PbS detectors for the near-infrared region. The use of the InGaAs and PbS detectors makes the sensitivity in the near-infrared region extremely high.
Up to now, all conventional spectrophotometers have used a photomultiplier tube detector for the ultraviolet and visible region and a PbS detector for the near-infrared region. However, neither detector is sensitive near the detector switchover, so high sensitivity measurement in this range is not possible with conventional spectrophotometers. The SolidSpec allows high sensitivity measurements even in the switchover range using an InGaAs detector.
Wider Wavelength Range
The SolidSpec-3700DUV uses materials with low absorption in deep UV for the light sources, detectors and integrating spheres. It has the capability to measure from 3300 nm down to the deep ultraviolet region at 165 nm with the direct detection unit (option) or to 175 nm with an integrating sphere, by purging both the optical and the sample compartment with nitrogen gas.
Extra Large Sample Compartment
The large sample compartment (900W x 700D x 350H, mm) allows large samples to be measured with a non-destructive analysis method. The vertical optical path makes it possible to measure large samples while keeping them horizontal. The entire sample area of 12 inches or 300 x 300 mm samples is measurable by mounting the automatic X-Y stage (option).
A wide variety of accessories, such as absolute specular reflectance attachments and relative specular reflectance attachments have been developed for the SolidSpec-3700DUV in order to expand its application range and makes this system unique in terms of flexibility. Automatic measurements can be performed with the optional automatic X-Y Stage by entering the intervals and the rotation angles for the sample.
The powerful software package UVProbe for system control and data processing functions allows an easy operation and includes a wide variety of data processing functions such as peak/valley detection, area calculation and others. Security features for each user, limiting the use of specific functions, and an audit trail for the instrument and the data are all standard features too.
The SolidSpec 3700/ 3700DUV is designed for the highest sensitivity. It is the first UV-VIS-NIR spectrophotometer with three detectors: a photomultiplier tube (PMT) detector for the ultraviolet and visible region, and furthermore InGaAs and PbS detectors for the near-infrared region. The use of the InGaAs and PbS detectors makes the sensitivity in the near-infrared region extremely high.
Up to now, all conventional spectrophotometers have used a photomultiplier tube detector for the ultraviolet and visible region and a PbS detector for the near-infrared region. However, neither detector is sensitive near the detector switchover, so high sensitivity measurement in this range is not possible with conventional spectrophotometers. The SolidSpec allows high sensitivity measurements even in the switchover range using an InGaAs detector.
Wider Wavelength Range
The SolidSpec-3700DUV uses materials with low absorption in deep UV for the light sources, detectors and integrating spheres. It has the capability to measure from 3300 nm down to the deep ultraviolet region at 165 nm with the direct detection unit (option) or to 175 nm with an integrating sphere, by purging both the optical and the sample compartment with nitrogen gas.
Extra Large Sample Compartment
The large sample compartment (900W x 700D x 350H, mm) allows large samples to be measured with a non-destructive analysis method. The vertical optical path makes it possible to measure large samples while keeping them horizontal. The entire sample area of 12 inches or 300 x 300 mm samples is measurable by mounting the automatic X-Y stage (option).
A wide variety of accessories, such as absolute specular reflectance attachments and relative specular reflectance attachments have been developed for the SolidSpec-3700DUV in order to expand its application range and makes this system unique in terms of flexibility. Automatic measurements can be performed with the optional automatic X-Y Stage by entering the intervals and the rotation angles for the sample.
The powerful software package UVProbe for system control and data processing functions allows an easy operation and includes a wide variety of data processing functions such as peak/valley detection, area calculation and others. Security features for each user, limiting the use of specific functions, and an audit trail for the instrument and the data are all standard features too.
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