ZEISS SIGMA VP by ZEISS Research Microscopy Solutions
Manufacturer ZEISS Research Microscopy Solutions
Field Emission-SEM for advanced analytical microscopyThe SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you analytical performance, integrated workflows and increased productivity. For the imaging of non-conducting samples, variable pressure modes of operation are available with ... Read more
ZEISS SIGMA VP
Average Rating: 5.0
2 Scientists have reviewed this product
Status:
Advanced Reviewer
Member since: 2007
Organization: IIT
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- Ease of use
- After sales service
- Value for money
This is a great tool for high quality research in nanotechnology & materials science.
Rating: 5.0
Application Area: Materials science, nanotechnology, semiconductor
"This model is very easy to use and provides a stable analytical platform, with extra high resolution imaging with the in-lens detector, that allows users to refine the beam. The VP feature allows a wide range of samples to be viewed with minimum sample preparation. Just mount the sample and view the image in a few minutes. Image navigation allows users to navigate samples easily at the click of the mouse, a must have time saving feature. The integrated keyboard is also very useful in this machine. We are highly impressed with the performance of this equipment."
Review date: 22 May 2020 | ZEISS SIGMA VP
Status:
Reviewer Member since: 2012
Organization: University Of Glasgow
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- Ease of use
- After sales service
- Value for money
Rating: 5.0
Review date: 13 Nov 2012 | ZEISS SIGMA VP
Application Area:Materials analysis
"The Sigma is easy to use and provides a stable analytical platform, with extra high resolution imaging with the in-lens detector, that allows users to refine the beam. The VP feature allows a wide range of sample to be viewed with minimum sample prep. Just mount and view. Image navigation allows users to navigate samples easily with the click of the mouse, a must have time saving feature. The integrated keyboard is also a must have."
Review date: 13 Nov 2012 | ZEISS SIGMA VP
Field Emission-SEM for advanced analytical microscopy
The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you analytical performance, integrated workflows and increased productivity.
For the imaging of non-conducting samples, variable pressure modes of operation are available with SIGMA VP. It is compatible with a wealth of accessories including the class leading BSD an VPSE G3 detectors for superior materials contrast and SE imaging in VP.
The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you analytical performance, integrated workflows and increased productivity.
For the imaging of non-conducting samples, variable pressure modes of operation are available with SIGMA VP. It is compatible with a wealth of accessories including the class leading BSD an VPSE G3 detectors for superior materials contrast and SE imaging in VP.
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