Field Emission-SEM for advanced analytical microscopy
The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you analytical performance, integrated workflows and increased productivity.
For the imaging of non-conducting samples, variable pressure modes of operation are available with SIGMA VP. It is compatible with a wealth of accessories including the class leading BSD an VPSE G3 detectors for superior materials contrast and SE imaging in VP.
Receive your quote directly from ZEISS Microscopy.
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Member since: 2012
Organization: University Of Glasgow