Field Emission-SEM for advanced analytical microscopy
The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA series brings you analytical performance, integrated workflows and increased productivity.
For the imaging of non-conducting samples, variable pressure modes of operation are available with SIGMA VP. It is compatible with a wealth of accessories including the class leading BSD an VPSE G3 detectors for superior materials contrast and SE imaging in VP.
"The Sigma is easy to use and provides a stable analytical platform, with extra high resolution imaging with the in-lens detector, that allows users to refine the beam. The VP feature allows a wide range of sample to be viewed with minimum sample prep. Just mount and view. Image navigation allows users to navigate samples easily with the click of the mouse, a must have time saving feature. The integrated keyboard is also a must have."
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