Scanning Probe Microscope Series WITec alpha300 The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications. For example, it is possible to start with Confocal Raman Microscopy and upgrade later to Atomic Force Microscopy or vice versa. With such a combined instrument, chemical information can be directly linked to structural AFM information from the same sample area using only one instrument. For high-resolution optical information, the system can even be equipped with SNOM capabilities. All of these methods enable nondestructive sample analysis on the nanometer scale while requiring only ...Read more
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