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Member since: 2010
Organization: Duke University
Scanning Near-field Optical Microscope alpha300 S - Reliable and Sophisticated SNOM Imaging – Beyond the Diffraction Limit
The design of the alpha300 S Scanning Near-field Optical Microscope features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM.
For scanning near-field optical microscopy, the alpha300 S uses unique and patented micro-fabricated Cantilever SNOM-sensors that significantly outperform standard fiber optic probes in resolution, transmission, ease of operation and reliability. The cantilever, employing the well established beam deflection principle for distance control, features a hollow pyramid with an aperture at its apex. This allows topography and optical images to be acquired simultaneously.
All standard optical modes such as transmission, reflection and fluorescence are available. When using AFM-cantilever tips, all standard AFM modes are readily accessible. The alpha300 S has a modular design, is very flexible and can be easily configured for a wide variety of applications and individual requirements. Typical applications for SNOM are found in materials science, life science, and nanophotonics or nanotechnology.