S-3400N Fully Automated VP SEM

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S-3400N Fully Automated VP SEM
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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The New Analytical Chamber Provides • Segment, Ultra Thin, Backscattered Electron Detector Capable of TV Rate Observation • Fully Automated with One Button Automatic "No Touch" Objective Aperture Alignment • Turbo Molecular Pump (TMP) Provides a Fast and Efficient 90 second Pump Down Time. The S-3400N is Hitachi’s newest addition to a world class Variable Pressure SEM line-up. Built on the success of the S-3000 series instruments, the S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. A new analytical chamber provides a total of ten ports with three h...Read more

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2 Scientists have reviewed this product


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Average Rating: 4.7

Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
Rating: 4.3
Ease of use
5 out of 5
After sales service
4 out of 5
Value for money
4 out of 5
  • Review date: 16 May 2012

  • Application Area: Catalyst and Materials Science

  • S-3400N Fully Automated VP SEM

"Easy sample introduction and extraction. Good instrument for research and education. Used by our integrated Materials Characterization lab with XRD, XRF, TA & FTIR."

Description

The S-3400N is the World Class Variable Pressure SEM

The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment.

The New Analytical Chamber Provides
• Segment, Ultra Thin, Backscattered Electron Detector Capable of TV Rate Observation
• Fully Automated with One Button Automatic "No Touch" Objective Aperture Alignment
• Turbo Molecular Pump (TMP)

Provides a Fast and Efficient 90 second Pump Down Time. The S-3400N is Hitachi’s newest addition to a world class Variable Pressure SEM line-up. Built on the success of the S-3000 series instruments, the S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. A new analytical chamber provides a total of ten ports with three high take off angle ports for EDS, Full Focusing WDS, PBS, EBSD, and XRF. A BSE detector allows TV rate scanning and high resolution imaging. Hitachi’s fQuad variable gun bias and SE accelerator plate ensures high currents for low voltage applications now approaching Field Emission performance.

Product Overview

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S-3400N Fully Automated VP SEM

by Hitachi High Technologies America, Inc.

4.7/5.0 (2 reviews)
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
5 out of 5






Receive your quote directly from Hitachi High Technologies America, Inc. for S-3400N Fully Automated VP SEM

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