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The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallography. The flexible system works with wavelengths from Cr to Ag without compromising data quality. The extremely large aperture means that the full resolution range for any wavelength can be covered very easily.
The R-AXIS RAPID is the system of choice for the most demanding applications, including charge-density work, complicated twins and studies on diffuse scattering. Other applications include micro-diffraction, measurement of weakly diffracting disordered materials, wide angle X-ray scattering (WAXS), stress and texture measurements, and general purpose powder diffraction.
RAPID II: Curved Imaging Plate Area Detector Features & Benefits:
- No compromise molecular structure determination
- Multiple and dual wavelengths available
- Cu, Mo, Ag, etc.
- Fast data collection
- High dynamic range and low background noise
- High-resolution charge density measurements
- Measure weakly diffracting disordered materials
- Powder diffraction
- Micro-diffraction
- Diffuse scattering
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