QUANTAX Micro-XRF by Bruker Nano Surfaces and Metrology
Manufacturer Bruker Nano Surfaces and Metrology
QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis
QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis.
QUANTAX Micro-XRF Features:
Distribution analysis with HyperMap stores complete spectra for e... Read more
QUANTAX Micro-XRF
QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis
QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis.
QUANTAX Micro-XRF Features:
- Distribution analysis with HyperMap stores complete spectra for every map point for on- and offline analysis.
- Samples can be analyzed with Micro-XRF and EDS without position change.
- Both methods are integrated in the same analytical software suite - ESPRIT 2.0.
- No interference with normal SEM operation, XTrace can stay in its measurement position most of the time.
- Analytical results compare to those of standalone systems.
- Image tiling allows mapping large areas.
- Selectable primary radiation filters to suppress diffraction peaks.
- Uses the SEM motorized stage.
- Allows sample tilt to produce minimum spot sizes.
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