Status:
ReviewerMember since: 2013
Organization: Polytechnic Institute of New York University
Application Area: Raman spectroscopy
"The QE65000 spectrometer is what we selected when building the in-situ Raman spectroscopy analysis system. The cooled detector is the best part of this spectrometer. It reduced noise greatly. We need to collect a very weak signal for a long period of time (several minutes). The S/N ratio is very good with that. And the maximum collection time is 15min. That means you can go even further with an even weaker signal. Great choice to build your own Raman system."
Status:
ReviewerMember since: 2010
Organization: University of Florida
"The hardware is great but the software and software development for our own use was very poor. We used the basic software provided but this was only working on Windows XP. Once we wanted to upgrade to Vista or 7 we were told to buy a new software which was very expensive."
The QE65000 has a Hamamatsu back-thinned detector with great response in the UV. Its 2D arrangement of pixels (1044 horizontal x 64 vertical) is responsive from 200-1100 nm. The specific range and resolution are determined by your grating and entrance slit selections. The detector’s columns are binned, or summed, inside the detector prior to the readout process, thereby minimizing readout noise.
The detector can be cooled down to -20.0 ºC with the onboard TE-cooler to reduce dark noise. The reduction of noise and dark signal allows integration times of the spectrometer of up to 15 minutes, which greatly enhances the detection limit in low-light level applications.
The combination of the spectrometer’s low-noise detector and 16-bit A/D Converter delivers a dynamic range of 25000:1 and a signal-to-noise ratio of >1000:1.
The back-thinned detector in the QE65000 has great native response in the UV and does not require additional coatings to enhance its performance.
The QE65000 is a great option for low-light level applications including fluorescence, Raman spectroscopy, DNA sequencing, astronomy and thin-film reflectivity.