NSG10 AFM Mode Non-Contact Probe

NSG10 AFM Mode Non-Contact Probe
by K-TEK Nanotechnology


K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG10 non-contact AFM probe: ...read more

Request Pricing




Receive your quote directly from K-TEK Nanotechnology for NSG10 AFM Mode Non-Contact Probe

Description

 

K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe

This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.

Available Options with the K-TEK NSG10 non-contact AFM probe:
 
-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*

*Quantity & cantilever restrictions apply. 

NSG10 AFM Cantilever Specification

Resonant frequency kHz:
min 140, typical 240, max 390
Force constant N/m: min 3.1, typical 11.8, max 37.6

Product Overview

NSG10 AFM Mode Non-Contact Probe by K-TEK Nanotechnology
NSG10 AFM Mode Non-Contact Probe

SelectScience Trusted Banner

Why make an inquiry with SelectScience?

Advertisement

Advertisement