K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe
This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.
Available Options with the K-TEK NSG10 non-contact AFM probe:
-PtIr, TiN, and Au tip coatings -CoCr magnetic tip coating* -Bare -Tipless*
*Quantity & cantilever restrictions apply.
NSG10 AFM Cantilever Specification
Resonant frequency kHz: min 140, typical 240, max 390 Force constant N/m: min 3.1, typical 11.8, max 37.6
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