NSG10 AFM Mode Non-Contact Probe
K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe
This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.
Available Options with the K-TEK NSG10 non-contact AFM probe:
-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
*Quantity & cantilever restrictions apply.
NSG10 AFM Cantilever Specification
Resonant frequency kHz: min 140, typical 240, max 390
Force constant N/m: min 3.1, typical 11.8, max 37.6