K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe
This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory.
Available Options with the K-TEK NSG03 AFM Mode Non Contact Probe:
-PtIr, TiN, and Au tip coatings -CoCr magnetic tip coating* -Bare -Tipless*
*Quantity & cantilever restrictions apply.
NSG03 AFM Cantilever Specification
Resonant frequency kHz: min 47, typical 90, max 150 Force constant N/m: min 0.35, typical 1.74, max 6.1
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