NSG03 AFM Mode Non-Contact Probe

Product Image
NSG03 AFM Mode Non-Contact Probe
  • placeholder

K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe

This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory.

Available Options with the K-TEK NSG03 AFM Mode Non Contact Probe:

-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*

*Quantity & cantilever restrictions apply.

NSG03 AFM Cantilever Specification

Resonant frequency kHz:
min 47, typical 90, max 150
Force constant N/m: min 0.35, typical 1.74, max 6.1

Receive your quote directly from K-TEK Nanotechnology.

Reviews

0 Scientists have reviewed this product


Write the First Review

No Reviews

Description

K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe

This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory.

Available Options with the K-TEK NSG03 AFM Mode Non Contact Probe:

-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*

*Quantity & cantilever restrictions apply.

NSG03 AFM Cantilever Specification

Resonant frequency kHz:
min 47, typical 90, max 150
Force constant N/m: min 0.35, typical 1.74, max 6.1

Product Overview

Product Image






Receive your quote directly from K-TEK Nanotechnology for NSG03 AFM Mode Non-Contact Probe

Advertisement