NSG03 AFM Mode Non-Contact Probe by K-TEK Nanotechnology

K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory. Available Options with the K-TEK NSG03 AFM Mode Non Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic tip coating* ... Read more

NSG03 AFM Mode Non-Contact Probe

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K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe

This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory.

Available Options with the K-TEK NSG03 AFM Mode Non Contact Probe:

-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*

*Quantity & cantilever restrictions apply.

NSG03 AFM Cantilever Specification

Resonant frequency kHz: min 47, typical 90, max 150
Force constant N/m: min 0.35, typical 1.74, max 6.1

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