The NFS-200/300 is a new kind of micro-spectrometer for observation of photoluminescence, fluorescence and Raman spectra at sub-wavelength high-spatial resolution.
Spectra and spectrally resolved mapped images can be obtained from single semiconductor quantum dots and wires at better than 100 nm spatial resolution.
Metals, semiconductors, plastics and biological materials can be examined and sample preparation is unnecessary.
Images can be generated by both topography (optical contrast and probe feedback) and PL emission or Raman spectral mapping from the near- UV to NIR wavelength range.
The NFS-200 can actually map a sample within the area of a single micro-Raman confocal laser spot with better than 0.5 cm-1 spectral resolution.
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