The NFS-200/300 is a new kind of micro-spectrometer for observation of photoluminescence, fluorescence and Raman spectra at sub-wavelength high-spatial resolution.
- Spectra and spectrally resolved mapped images can be obtained from single semiconductor quantum dots and wires at better than 100 nm spatial resolution.
- Metals, semiconductors, plastics and biological materials can be examined and sample preparation is unnecessary.
- Images can be generated by both topography (optical contrast and probe feedback) and PL emission or Raman spectral mapping from the near- UV to NIR wavelength range.
- The NFS-200 can actually map a sample within the area of a single micro-Raman confocal laser spot with better than 0.5 cm-1 spectral resolution.