NanoWizard II by JPK Instruments

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NanoWizard II

NanoWizard II

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3.7/5.0 (1 review)

JPK Instruments

Ease of use 2 out of 5
After sales service 5 out of 5
Value for money 4 out of 5

Manufacturer website

Description

New standards for soft matter and life science AFM
Most stable platform for highest resolution in imaging and force measurements
Stand-alone tip scanning design for flexibility in the applications
Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon
Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
Patented DirectOverlay™ software feature for combining AFM and optical images distortion free
In-situ imaging in biological/chemical fluids or in air
Measurements at variable temperatures with perfusion possibilities
Large scan field of 100×100×15 µm3 with highest closed loop performance through capacitive sensors

Application notes and news

Reviews

Marta Larraona-puy

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Member since 2012

Job Title:
Research Scientist / Senior / PI
Discipline:
Materials testing
Work Field:
Academia / University
Organization:
Stockholm University
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RATING: 3.7

2 out of 5EASE OF USE
5 out of 5AFTER SALES SERVICE
4 out of 5VALUE FOR MONEY

Review date: 30 Oct 2012

Application Area: Thin lipid films
NanoWizard II

"The microscope objective wheel is a problem. You are not able to use different microscope objectives with the sample. However, the rest is OK and it is easier than silicon to approach. But I do find it annoying to load the tips with the spring system."