NanoWizard II by JPK Instruments

Manufacturer JPK Instruments
3.7
/
5.0
  |  1 reviews
New standards for soft matter and life science AFM Most stable platform for highest resolution in imaging and force measurements Stand-alone tip scanning design for flexibility in the applications Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...) Patented DirectOverlay™ software feature for combining AFM and optical images distortion free In-situ imaging in biological/chemical... Read more


NanoWizard II by JPK Instruments product image
NanoWizard II

JPK Instruments

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Average Rating: 3.7
1 Scientist has reviewed this product

2 out of 5
Ease of use
5 out of 5
After sales service
4 out of 5
Value for money


Rating: 3.7

  • Application Area: Thin lipid films

"The microscope objective wheel is a problem. You are not able to use different microscope objectives with the sample. However, the rest is OK and it is easier than silicon to approach. But I do find it annoying to load the tips with the spring system."

Review date: 30 Oct 2012 | NanoWizard II
  • New standards for soft matter and life science AFM
  • Most stable platform for highest resolution in imaging and force measurements
  • Stand-alone tip scanning design for flexibility in the applications
  • Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon
  • Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
  • Patented DirectOverlay™ software feature for combining AFM and optical images distortion free
  • In-situ imaging in biological/chemical fluids or in air
  • Measurements at variable temperatures with perfusion possibilities
  • Large scan field of 100×100×15 µm3 with highest closed loop performance through capacitive sensors

Product Overview

NanoWizard II by JPK Instruments product image

NanoWizard II

Manufacturer JPK Instruments

3.7 / 5.0 | 1 reviews