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4 Scientists have reviewed this product
4 out of 5
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money
"Great tool for sample analysis"
Review date: 15 Nov 2021 |
NANOSTAR Rating: 3.0
"It needs to be aligned perfectly and the calibration of the system is not so easy. The device is so handy, however, the price is not reasonable. In term of the results I recommend it."
Review date: 16 Dec 2017 |
NANOSTAR - Bruno Schilling
Status:
Reviewer Member since: 2008
Organization: EPCOS
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- Ease of use
- 5 out of 5
- After sales service
- 5 out of 5
- Value for money
- 5 out of 5
Rating: 5.0
"Satisfied about characteristics and working tool for our application."
Review date: 22 Dec 2016 |
NANOSTAR Rating: 3.3
"The instrument is very well made. No significant problems after 5 years of usage. Just normal maintenance. After sales service is very helpful and ready to give you assistance for every problem. I would definitely recommend this product to a colleague."
Review date: 24 Oct 2012 |
NANOSTAR NANOSTAR – Synchrotron SAXS beamline design
Brilliant X-ray sources are combined with innovative multi-layer optics, which provides an intense, point-like incident beam upon the sample. Thanks to the 3-pinhole collimation, the background is extremely low, which is a must for the analysis of weakly scattering samples. The VÅNTEC-2000 is a large 2-D detector with true photon counting ability, featuring a maximum performance in angular resolution, low background and dynamic range. Such a large 2-dimensional detector is essential for SAXS/GISAXS measurements as it avoids any potential misinterpretation of data, eliminating the need for restrictive initial assumptions about the sample. In fact, the NANOSTAR analyzes pure sample properties, even for non-isotropic sample systems. Additionally, a real space image with µm SAXS resolution of the sample can be taken by performing Nanography.