Status:
Advanced ReviewerMember since: 2016
Organization: Okinawa Institute of Science and Technology Graduate University, Okinawa, Japan
Great results on nanoparticles & helpful to analyze the other properties
Application Area: Nanoparticles properties
"This instrument is extremely easy to use. I had a nice experience working with Multimode AFM system from last 5 years. This system very sensitive for material surfaces with high resolution."
Setting the Standard for High-Performance SPMs with the MultiMode® 8 Scanning Probe Microscope (SPM):
• Highest Performance and Resolution
• Versatility to Satisfy More Applications
• Faster and Easier Expert-Quality Results
• World-Renowned Productivity and Reliability