Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Ref...read more
Organization: University Of California, Davis Read more »
5 out of 5EASE OF USE
3 out of 5AFTER SALES SERVICE
3 out of 5VALUE FOR MONEY
Review date: 25 Jan 2010
"A reliable product."
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating.
Tip Specification Sharpened Microlevers
Geometry: Cast Tip Height (h): 2.5 - 8.0µm Front Angle (FA): 15 ± 2.5° Back Angle (BA): 25 ± 2.5° Side Angle (SA): 22.5 ± 2.5° Tip Radius (Nom): 10nm Tip Radius (Max): 40nm Tip SetBack (TSB)(Nom): 4µm Tip Set Back (TSB)(RNG): 3 - 5.5µm
Cantilever Specification Au reflective coating
Material: Silicon Nitride Thickness (t)(Nom): 0.55µm Thickness (t)(RNG): 0.5 - 0.6µm Back Side Coating: Gold Reflective
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