Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating.
Tip Specification Sharpened Microlevers Geometry: Cast Tip Height (h): 2.5 - 8.0µm Front Angle (FA): 15 ± 2.5° Back Angle (BA): 25 ± 2.5° Side Angle (SA): 22.5 ± 2.5° Tip Radius (Nom): 10nm Tip Radius (Max): 40nm Tip SetBack (TSB)(Nom): 4µm Tip Set Back (TSB)(RNG): 3 - 5.5µm
Canti... Read more
MSCT Probes
Average Rating: 3.7
1 Scientist has reviewed this product
Status:
Reviewer
Member since: 2010
Organization: University Of California, Davis
-
- Ease of use
- After sales service
- Value for money
Rating: 3.7
"A reliable product."
Review date: 25 Jan 2010 | MSCT Probes
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating.
Tip Specification
Sharpened Microlevers
Geometry: Cast
Tip Height (h): 2.5 - 8.0µm
Front Angle (FA): 15 ± 2.5°
Back Angle (BA): 25 ± 2.5°
Side Angle (SA): 22.5 ± 2.5°
Tip Radius (Nom): 10nm
Tip Radius (Max): 40nm
Tip SetBack (TSB)(Nom): 4µm
Tip Set Back (TSB)(RNG): 3 - 5.5µm
Cantilever Specification
Au reflective coating
Material: Silicon Nitride
Thickness (t)(Nom): 0.55µm
Thickness (t)(RNG): 0.5 - 0.6µm
Back Side Coating: Gold Reflective
Product Overview
