MICROLAB 350 - Auger Electron Spectrometer by Thermo Fisher Scientific

4.5

5.0

MICROLAB 350 is a high-performance, scanning Auger Electron Spectrometer (AES) with High Sensitivity and High Energy Resolution. SEM resolution <7 nm and Scanning Auger Mapping (SAM) resolution <12 nm. Product detail: High-performance scanning Auger electron spectrometer (AES) Secondary Electron Mapping (SEM) at <7 nm Resolution Scanning Auger Mapping (SAM) at <12 nm Resolution ... Read more

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MICROLAB 350 - Auger Electron Spectrometer

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Reviews
Description

Average Rating: 4.5

2 Scientists have reviewed this product

5 out of 5
Ease of use

4 out of 5
After sales service

5 out of 5
Value for money

Write your own review

SOUNAK CHAKRABORTY
Status:
Reviewer
Member since: 2019
Organization: Public Health Engineering Laboratory

Ease of use

5 out of 5

After sales service

5 out of 5

Value for money

5 out of 5

Very good result. Easy to use

Rating: 5.0

Application Area: Spectrum analysis

"Ease to use, spectrum is very good. Handling is good"

Review date: 21 Mar 2023 | MICROLAB 350 - Auger Electron Spectrometer

zhang jun
Status:
Reviewer
Member since: 2010
Organization: Research Center of Environmental Science and Engineering, Department of Chemistry, Shanxi University, Shanxi 030006, PR China

Ease of use

4 out of 5

After sales service

3 out of 5

Value for money

5 out of 5

Rating: 4.0

"MICROLAB 350 is a high-performance, scanning Auger Electron Spectrometer (AES) with high sensitivity and high energy resolution. SEM resolution."

Review date: 08 Sep 2014 | MICROLAB 350 - Auger Electron Spectrometer

Product detail:

High-performance scanning Auger electron spectrometer (AES)

Secondary Electron Mapping (SEM) at <7 nm Resolution
Scanning Auger Mapping (SAM) at <12 nm Resolution
High Sensitivity
Spherical Sector Analyser Allows High Energy Resolution for:
Chemical state determination
Reflected Electron Energy Loss Spectroscopy (REELS)
Measurement of dopants in silicon
Multitechnique Capability Including:
X-ray photoelectron spectroscopy (XPS)
Energy dispersive X-ray spectroscopy (EDX)
Backscattered electron detection
FIB
Preparation Facilities Including:
Fracture Stage
Heating/Cooling Stage
Evaporation Stage

Product Overview