The MATRIX™-I is a rugged FT-NIR spectrometer designed for QA/QC analysis. The instrument comes equipped with an integrating sphere in the sampling area. This permits fast and easy analysis using the diffuse reflectance technique. Samples can be measured directly in their containers or poured into standard cups. This method is ideal for measuring large amounts of materials and is particularly useful for analyzing inhomogeneous samples or large particle size items such as grains or seeds.
Technologies used are protected by one or more of the following patents: US 5309217; DE 4212143; US 5923422; DE 19704598
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