Magellan XHR Scanning Electron Microscope by FEI Company
Manufacturer FEI Company
Discover the world of Extreme High Resolution SEM The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.
The supplier does not provide quotations for this product through SelectScience. Browse these related products instead
Magellan XHR Scanning Electron Microscope
Average Rating: 4.9
2 Scientists have reviewed this product
Status:
Reviewer
Member since: 2012
Organization: Vienna University Of Technology
-
- Ease of use
- After sales service
- Value for money
Rating: 4.7
Application Area: Stem
"This is very perfect instrument for scanning transmission electron microscopy. Many samples can be studied by the instrument. The image is produced fast."
Review date: 19 Sep 2012 | Magellan XHR Scanning Electron Microscope
Status:
Reviewer Member since: 2010
Organization: NIH
-
- Ease of use
- After sales service
- Value for money
Rating: 5.0
Review date: 18 Jan 2010 | Magellan XHR Scanning Electron Microscope
Review date: 18 Jan 2010 | Magellan XHR Scanning Electron Microscope
Discover the world of Extreme High Resolution SEM
The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.
The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.
Product Overview
