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2 Scientists have reviewed this product
5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
"This is very perfect instrument for scanning transmission electron microscopy. Many samples can be studied by the instrument. The image is produced fast."
Review date: 19 Sep 2012 |
Magellan XHR Scanning Electron Microscope - Richard Rodewald
Status:
Reviewer Member since: 2010
Organization: NIH
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- Ease of use
- 5 out of 5
- After sales service
- 5 out of 5
- Value for money
- 5 out of 5
Rating: 5.0
Review date: 18 Jan 2010 | Magellan XHR Scanning Electron Microscope
Discover the world of Extreme High Resolution SEM
The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.