Magellan XHR Scanning Electron Microscope

Magellan XHR Scanning Electron Microscope
by FEI Company
 4.9/5.0 (2 reviews)

Discover the world of Extreme High Resolution SEM

The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.

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Reviews

AVERAGE RATING: 4.9

2 scientists have reviewed this product

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  • 5 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY

Zhenbao Feng


Status:


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Member since 2012

Organization:
Vienna University Of Technology
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RATING: 4.7

  • 5 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 19 Sep 2012

Application Area: Stem
Magellan XHR Scanning Electron Microscope

"This is very perfect instrument for scanning transmission electron microscopy. Many samples can be studied by the instrument. The image is produced fast."

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Richard Rodewald


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Member since 2010

Organization:
NIH
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RATING: 5.0

  • 5 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 5 out of 5VALUE FOR MONEY




Review date: 18 Jan 2010

Magellan XHR Scanning Electron Microscope

Description

 

Discover the world of Extreme High Resolution SEM

The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.

Product Overview

Magellan XHR Scanning Electron Microscope by FEI Company
Magellan XHR Scanning Electron Microscope




  • 5out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY





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