Magellan XHR Scanning Electron Microscope

by FEI Company

4.9/5.0 (2 reviews)

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Magellan XHR Scanning Electron Microscope
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Discover the world of Extreme High Resolution SEM

The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.

Receive your quote directly from FEI Company for Magellan XHR Scanning Electron Microscope

Reviews

2 Scientists have reviewed this product


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Average Rating: 4.9

Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
Rating: 4.7
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
4 out of 5
  • Review date: 19 Sep 2012

  • Application Area: Stem

  • Magellan XHR Scanning Electron Microscope

"This is very perfect instrument for scanning transmission electron microscopy. Many samples can be studied by the instrument. The image is produced fast."

Rating: 5.0
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
  • Review date:18 Jan 2010

  • Magellan XHR Scanning Electron Microscope

Description

Discover the world of Extreme High Resolution SEM

The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.

Product Overview

Product Image

Magellan XHR Scanning Electron Microscope

by FEI Company

4.9/5.0 (2 reviews)
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
5 out of 5






Receive your quote directly from FEI Company for Magellan XHR Scanning Electron Microscope