Magellan XHR Scanning Electron Microscope
| Zhenbao Feng|
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Member since 2012
Vienna University Of Technology
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"This is very perfect instrument for scanning transmission electron microscopy. Many samples can be studied by the instrument. The image is produced fast."
Discover the world of Extreme High Resolution SEM
The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the full 500 eV to 30 keV energy range and excellent contrast needed for precise measurements on materials in advanced Semiconductor manufacturing, Life Science and Materials Science applications.