JSM-7000F Scanning Electron Microscope

Manufacturer JEOL USA
5.0
/
5.0
  |  1 reviews


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Average Rating: 5.0
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
The JSM-7000F offers high resolution, a multi-purpose specimen chamber, a motorized, automated specimen stage, one-action specimen exchange, and ideal geometry with large probe current at small probe diameter for EDS, WDS, EBSP, and CL.

Along with a Windows® 2000 based computer Intuitive User Interface which allows for unprecedented ease of operation, the JSM-7000F SEM also supports full integration of EDS, WDS, e-beam lithography, and an image database. Stage automation is standard with a 5 axis computer control of X, Y, Z Tilt and eucentric rotation.

Product Overview

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JSM-7000F Scanning Electron Microscope

Manufacturer JEOL USA

5.0 / 5.0 | 1 reviews