JSM-6610LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope for fast characterization and imaging of fine structures on both small and large samples. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6610LV enables observation of specimens up to 200mm in diameter. The selectable Low Vacuum mode of the JEOL JSM-6610LV allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because they have a non-conductive surface. Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resol...Read more
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