JSM-6510LV Scanning Electron Microscope

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JSM-6510LV Scanning Electron Microscope
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JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron microscope for fast characterization and imaging of fine structures. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6510LV enables observation of specimens up to 150mm in diameter. The selectable Low Vacuum mode of the JEOL JSM-6510LV allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because they have a non-conductive surface. Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatili...Read more

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JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs! 

The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron microscope for fast characterization and imaging of fine structures. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6510LV enables observation of specimens up to 150mm in diameter.

The selectable Low Vacuum mode of the JEOL JSM-6510LV allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because they have a non-conductive surface.

Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface.

With a high resolution of 3.0nm at 30kV, the JSM-6510LV delivers amazing clarity of the finest structures. In addition to routine imaging at several hundreds of times greater resolution than the optical microscope, and with a focal depth several tens of times greater than the optical microscope, the SEM allows for detailed measurements, including 3D measurement from stereo images. Dual live image display of the secondary electron image and a backscattered composition image allow the user to contrast and compare specific details. An optional energy dispersive X-ray spectrometer (EDS) provides elemental analysis.

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JSM-6510LV Scanning Electron Microscope

by JEOL USA

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