JSM-6490LV Scanning Electron Microscope

Manufacturer JEOL USA
4.4
/
5.0
  |  3 reviews


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Average Rating: 4.4
3 Scientists have reviewed this product

4 out of 5
Ease of use
5 out of 5
After sales service
4 out of 5
Value for money
  • Status:

    Reviewer

  • Member since: 2011

  • Organization: MVA Scientific Consultants



  • Ease of use
    4 out of 5
    After sales service
    5 out of 5
    Value for money
    4 out of 5
Rating: 4.3
"Robust system with little maintenance."

Review date: 08 Jun 2011 | JSM-6490LV Scanning Electron Microscope
  • Status:

    Reviewer

  • Member since: 2011

  • Organization: MVA Scientific Consultants



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
Rating: 5.0
"Easy to use."

Review date: 08 Jun 2011 | JSM-6490LV Scanning Electron Microscope
The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter. Standard automated features include Auto Focus/Auto Stigmator, Auto Gun (saturation, bias and alignment), and Automatic Contrast and Brightness.

Other features include:

■ Fast, unattended data acquisition
■ Smart settings for common samples
■ Streamlined design
■ Compact footprint
■ Customized toolbars for repetitive functions
■ Enhanced SE imaging
■ Super conical lens
■ Fully automatic vacuum system
■ Large specimen chamber
■ LV secondary electron detector (option)

New features include:

■ Improved low kV imaging in both high and low vacuum
■ Multiple live image display (including picture in picture)
■ Signal mixing
■ Live, full screen image
■ Video capability (.avi files) 
 
The JSM-6490LV is used in varied applications with several options that increase its versatility. It can also be expanded to an analytical SEM by the addition of optional EDS, WDS or EBSD.

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JSM-6490LV Scanning Electron Microscope

Manufacturer JEOL USA

4.4 / 5.0 | 3 reviews