JSM-6490LV Scanning Electron Microscope

JSM-6490LV Scanning Electron Microscope
 4.4/5.0 (3 reviews)

JEOL USA

The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of speci...read more

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Reviews

Homero Pastrana


Status:


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Member since 2010

Job Title:
PhD Student
Discipline:
Nanotechnology
Work Field:
Nanobiotechnology
Organization:
Andes University
Read more »
RATING: 4.0

  • 4 out of 5EASE OF USE
  • 4 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 08 May 2012

Application Area: Materials
JSM-6490LV Scanning Electron Microscope

"Very easy to use, produces good quality images."

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Steven Compton


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Member since 2011

Organization:
MVA Scientific Consultants
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RATING: 4.3

  • 4 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 08 Jun 2011

JSM-6490LV Scanning Electron Microscope

"Robust system with little maintenance."

Pronda Few


Status:


See all reviews
Member since 2011

Organization:
MVA Scientific Consultants
Read more »
RATING: 5.0

  • 5 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 5 out of 5VALUE FOR MONEY




Review date: 08 Jun 2011

JSM-6490LV Scanning Electron Microscope

"Easy to use."

Description

 

The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter. Standard automated features include Auto Focus/Auto Stigmator, Auto Gun (saturation, bias and alignment), and Automatic Contrast and Brightness.

Other features include:

■ Fast, unattended data acquisition
■ Smart settings for common samples
■ Streamlined design
■ Compact footprint
■ Customized toolbars for repetitive functions
■ Enhanced SE imaging
■ Super conical lens
■ Fully automatic vacuum system
■ Large specimen chamber
■ LV secondary electron detector (option)

New features include:

■ Improved low kV imaging in both high and low vacuum
■ Multiple live image display (including picture in picture)
■ Signal mixing
■ Live, full screen image
■ Video capability (.avi files) 
 
The JSM-6490LV is used in varied applications with several options that increase its versatility. It can also be expanded to an analytical SEM by the addition of optional EDS, WDS or EBSD.

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