JIB-4501 MultiBeam SEM-FIB by JEOL USA
The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from FIB milling to SEM imaging to various analysis including EDS and EBSD. Features:High performance LaB6 SEM + High performance/high probe current FIB Simple operation of surface/internal 3D imaging and analysis in a single unit Optimum design for a complete operation from FIB milling to SEM imaging to various an...
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