The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from FIB milling to SEM imaging to various analysis including EDS and EBSD. Features:High performance LaB6 SEM + High performance/high probe current FIB Simple operation of surface/internal 3D imaging and analysis in a single unit Optimum design for a complete operation from FIB milling to SEM imaging to various an... Read more
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JIB-4501 MultiBeam SEM-FIB
The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from FIB milling to SEM imaging to various analysis including EDS and EBSD.
Features:
High performance LaB6 SEM + High performance/high probe current FIB
Simple operation of surface/internal 3D imaging and analysis in a single unit
Optimum design for a complete operation from FIB milling to SEM imaging to various analysis including EDS and EBSD
Real time monitoring of FIB milling in SEM
Standard auto milling recipes for unattended sample preparation
Supports multiple gas injection systems for protective film deposition
Low vacuum operation to protect non conductive samples from charge accumulation
Features:
High performance LaB6 SEM + High performance/high probe current FIB
Simple operation of surface/internal 3D imaging and analysis in a single unit
Optimum design for a complete operation from FIB milling to SEM imaging to various analysis including EDS and EBSD
Real time monitoring of FIB milling in SEM
Standard auto milling recipes for unattended sample preparation
Supports multiple gas injection systems for protective film deposition
Low vacuum operation to protect non conductive samples from charge accumulation
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