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The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. The JEM-2200FS also utilizes a new, rotation-free image-forming optical system which not only facilitates acquisition of TEM images and diffraction patterns but also produces stable spectra data.
Review date: 24 Oct 2012JEM-2200FS Transmission Electron Microscope
"The user interface is a bit out of date compared to competitors. Commands are sometimes counter-intuitive. However, great performance and capabilities."
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Review date: 15 Oct 2012JEM-2200FS Transmission Electron Microscope
"The instrument is excellent, but going from TEM to STEM needs corrections which can take time. Very good after sales service and value for money."
"Flexible application system. Remote controlled- good for stability and demonstrations. Reliable resolution and excellent support from Jeol in UK and Japan."
Review date: 27 Jul 2008JEM-2200FS Transmission Electron Microscope
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