JEM-2100F Transmission Electron Microscope

by JEOL USA

4.2/5.0 (9 reviews)

Product Image
JEM-2100F Transmission Electron Microscope
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The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.

The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F can be equipped with STEM, MDS, EDS, EELS, and CCD-cameras.

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Reviews

9 Scientists have reviewed this product


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Average Rating: 4.2

Ease of use
4 out of 5
After sales service
4 out of 5
Value for money
4 out of 5
Rating: 4.7
Ease of use
4 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
  • Review date: 26 Jun 2013

  • Application Area: Materials science

  • JEM-2100F Transmission Electron Microscope

"Very useful for finding out about the microstructure of materials at a good quality high resolution. Easy to operate and user-friendly."

Rating: 5.0
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
  • Review date:22 Oct 2012

  • JEM-2100F Transmission Electron Microscope

"User friendly, easy to handle your samples and cryopreparations. High resolution data. High quality service and easy to get in contact if service is needed. User handbook includes technical data, applications, as well as practical and theoretical advice on how to get good results."
Rating: 4.7
Ease of use
4 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
  • Review date:18 Oct 2012

  • Application Area:Bio-nano technology

  • JEM-2100F Transmission Electron Microscope

"Excellent microscope, high resolution as expected. Straightforward to use additional detectors e.g. EDX/EELS. It would be helpful if software for different components was better integrated."
Rating: 4.0
Ease of use
4 out of 5
After sales service
5 out of 5
Value for money
3 out of 5
  • Review date:15 Oct 2012

  • JEM-2100F Transmission Electron Microscope

"After training and with a base knowledge of TEM it's really simple to use it. The interface is user-friendly. The Italian service is really good and help is easily available, even by phone. It would have been good if all the applications were clear before purchase but on the whole I would recommend this equipment to a colleague."
Rating: 3.3
Ease of use
4 out of 5
After sales service
2 out of 5
Value for money
4 out of 5
  • Review date:15 Oct 2012

  • JEM-2100F Transmission Electron Microscope

"Filament source- so not as good as FEG, but the instrument is straight forward to use once you follow the manual. We are based in Ireland so it is more difficult to get technicians out to fix problems. It is one of the cheaper TEMs, however we manage to get decent images and the information we need such as crystallinity, size, etc."
Rating: 4.0
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money
4 out of 5
  • Review date:15 Oct 2012

  • JEM-2100F Transmission Electron Microscope

"Learning to use the microscope is a challenge, but once mastered it is user-friendly. It would be nice if there was some online software support."
Rating: 3.7
Ease of use
4 out of 5
After sales service
3 out of 5
Value for money
4 out of 5
  • Review date:11 Oct 2012

  • JEM-2100F Transmission Electron Microscope

"Easy to use and very useful for additional attachments bought over the years, so a flexible machine. I would recommend this good value for money machine."
Rating: 4.0
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money
4 out of 5
  • Review date:11 Oct 2012

  • JEM-2100F Transmission Electron Microscope

"Very good transmission electron microscope for the investigation of various specimens (from biological to metals). Easy to use and has the possibility to analyze the specimens in combination with other techniques."
Rating: 4.3
Ease of use
5 out of 5
After sales service
4 out of 5
Value for money
4 out of 5
  • Review date:10 Oct 2012

  • Application Area:Materials science

  • JEM-2100F Transmission Electron Microscope

"Easy to use, very user-friendly interface. Lots of extra equipment is available also. Easy enough to contact the company to service. I would recommend it to a colleague."

Description

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.

The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F can be equipped with STEM, MDS, EDS, EELS, and CCD-cameras.

Product Overview

Product Image

JEM-2100F Transmission Electron Microscope

by JEOL USA

4.2/5.0 (9 reviews)
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money
4 out of 5






Receive your quote directly from JEOL USA for JEM-2100F Transmission Electron Microscope