JEM-2100F Transmission Electron Microscope by JEOL USA

Manufacturer JEOL USA
4.2
/
5.0
  |  9 reviews
The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries. The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new si... Read more


JEM-2100F Transmission Electron Microscope by JEOL USA product image
JEM-2100F Transmission Electron Microscope



Average Rating: 4.2
9 Scientists have reviewed this product

4 out of 5
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money


  • Status:

    Reviewer
  • Member since: 2012

  • Organization: Yonsei University



  • Ease of use
    4 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Rating: 4.7

  • Application Area: Materials science

"Very useful for finding out about the microstructure of materials at a good quality high resolution. Easy to operate and user-friendly."

Review date: 26 Jun 2013 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: Karolinska Institute



  • Ease of use
    5 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Rating: 5.0
"User friendly, easy to handle your samples and cryopreparations. High resolution data. High quality service and easy to get in contact if service is needed. User handbook includes technical data, applications, as well as practical and theoretical advice on how to get good results."

Review date: 22 Oct 2012 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: UNIVERSITY OF BIRMINGHAM



  • Ease of use
    4 out of 5
    After sales service
    5 out of 5
    Value for money
    5 out of 5
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Rating: 4.7

  • Application Area:Bio-nano technology

"Excellent microscope, high resolution as expected. Straightforward to use additional detectors e.g. EDX/EELS. It would be helpful if software for different components was better integrated."

Review date: 18 Oct 2012 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: UNIVERSITY OF PALERMO



  • Ease of use
    4 out of 5
    After sales service
    5 out of 5
    Value for money
    3 out of 5
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Rating: 4.0
"After training and with a base knowledge of TEM it's really simple to use it. The interface is user-friendly. The Italian service is really good and help is easily available, even by phone. It would have been good if all the applications were clear before purchase but on the whole I would recommend this equipment to a colleague."

Review date: 15 Oct 2012 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: TYNDALL NATIONAL INSTITUTE UCC



  • Ease of use
    4 out of 5
    After sales service
    2 out of 5
    Value for money
    4 out of 5
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Rating: 3.3
"Filament source- so not as good as FEG, but the instrument is straight forward to use once you follow the manual. We are based in Ireland so it is more difficult to get technicians out to fix problems. It is one of the cheaper TEMs, however we manage to get decent images and the information we need such as crystallinity, size, etc."

Review date: 15 Oct 2012 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: Laas-cnrs



  • Ease of use
    4 out of 5
    After sales service
    4 out of 5
    Value for money
    4 out of 5
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Rating: 4.0
"Learning to use the microscope is a challenge, but once mastered it is user-friendly. It would be nice if there was some online software support."

Review date: 15 Oct 2012 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: Tyndall National Institute



  • Ease of use
    4 out of 5
    After sales service
    3 out of 5
    Value for money
    4 out of 5
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Rating: 3.7
"Easy to use and very useful for additional attachments bought over the years, so a flexible machine. I would recommend this good value for money machine."

Review date: 11 Oct 2012 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: Institute of Metals and Technology



  • Ease of use
    4 out of 5
    After sales service
    4 out of 5
    Value for money
    4 out of 5
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Rating: 4.0
"Very good transmission electron microscope for the investigation of various specimens (from biological to metals). Easy to use and has the possibility to analyze the specimens in combination with other techniques."

Review date: 11 Oct 2012 | JEM-2100F Transmission Electron Microscope
  • Status:

    Reviewer

  • Member since: 2012

  • Organization: RUSNANO METROLOGY CENTER LLC



  • Ease of use
    5 out of 5
    After sales service
    4 out of 5
    Value for money
    4 out of 5
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Rating: 4.3

  • Application Area:Materials science

"Easy to use, very user-friendly interface. Lots of extra equipment is available also. Easy enough to contact the company to service. I would recommend it to a colleague."

Review date: 10 Oct 2012 | JEM-2100F Transmission Electron Microscope
The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.

The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F can be equipped with STEM, MDS, EDS, EELS, and CCD-cameras.

Product Overview

JEM-2100F Transmission Electron Microscope by JEOL USA product image

JEM-2100F Transmission Electron Microscope

Manufacturer JEOL USA

4.2 / 5.0 | 9 reviews