Irtronµ sample compartment microscopy system
The Irtronµ sample compartment microscopy system is designed to provide affordable analysis of microscopic samples with the high performance features of an external FT-IR microscope accessory.
The Irtronµ offers unprecedented convenience and ease of use, compatible with the JASCO FT/IR-4000 and 6000 series FT-IR instruments. The microscope accessory installs into the spectrometer sample compartment in seconds without optical alignment. The state-of-the-art optical design guarantees high throughput for highly sensitive measurements of samples approaching 20 microns. The Irtronµ can be operated with the integrated touch panel or via a PC using the Spectra ManagerTM II software interface. The sample is observed with the integrated color CCD camera and a 5 inch TFT color LCD monitor. JASCO’s unique ATOS (Aperture Through Optical System) provides simultaneous viewing of the sample image and sampling location specified by the aperture.
- Compact and easy-to-use microscopy system
- Transmittance, reflectance and ATR (option) measurement modes
- Unique SmartMonitorTM function allows sample observation while monitoring the spectrum
- Optional sampling accessories for liquid and powder samples DLATGS, MCT or NIR optimized detector