The integrating sphere is very often an accessory of choice when studying reflectance properties of solids, analyzing light scattering and/or highly absorbing samples and collecting spectra difficult to obtain with standard sampling techniques. PIKE Technologies offers two Mid-IR integrating spheres, designed for research and standard applications that require high sensitivity, and a NIR integrating sphere. All spheres are designed to collect high quality data from difficult to analyze samples.
Primary reasons for using integrating spheres for the measurement of sample reflectance are the following:
• Efficient measurement of combined diffuse and specular reflectance
• Uniform detection of reflectance even when sample is Inhomogeneous
• Isotropic detection of reflectance even on samples that reflect in preferred directions Reduction of polarization effects from the illuminating beam and the sample
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