Inspect™ - Scanning Electron Microscope
|Akemi Nogiwa Valdez|
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Member since 2012
MERCURY CENTRE - UNIVERSITY OF SHEFFIELD
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"Very easy to use interface that makes analysis time shorter than with other equipment. Good resolution at SkeV for fine grain size microstructures. Large entry chamber gives flexibility for wide range of sample sizes."
With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models’ high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses.