With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When inspection, chara...read more
Organization: MERCURY CENTRE - UNIVERSITY OF SHEFFIELD Read more »
5 out of 5EASE OF USE
4 out of 5AFTER SALES SERVICE
4 out of 5VALUE FOR MONEY
Review date: 05 Nov 2012
Application Area: Materials science Inspect™ - Scanning Electron Microscope
"Very easy to use interface that makes analysis time shorter than with other equipment. Good resolution at SkeV for fine grain size microstructures. Large entry chamber gives flexibility for wide range of sample sizes."
With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models’ high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses.
Write a review
Sharing your experience will help scientists like you. Achieve Reviewer Status and Win an iPad air (All reviews published will be entered into the next drawing on March 30th 2014).
Join the Global SelectScience Community Today! It’s FREE!
Helping you make informed decisions about the latest lab products and technologies:
Be the first to learn about new technologies
10,000+ trusted product reviews from your peers
Compare 500,000 products and manufacturers
Get exclusive buying tips from experts
Find solutions fast: 10,000+ Application Notes, Webinars and Videos
Connect with 250,000 scientists... All in one place!