With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models’ high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses.
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Member since: 2012
Organization: MERCURY CENTRE - UNIVERSITY OF SHEFFIELD