Innova-IRIS by Bruker Nano Surfaces and Metrology

Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.

This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.


Features:

• Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results
• Experiment Selector” distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS setups
• Fully featured suite of advanced topographic, electrical, mechanical, and thermal AFM capabilities enables correlated property mapping
• System design for noise and drift elimination enables high-resolution imaging and long Raman integration times
• Modular accessories tailor system to targeted applications
• Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples
• Innova-IRIS is compatible with Bruker's new high-contrast IRIS TERS probes, providing a complete TERS solution with highest sensitivity and spatial resolution

Applications:

• Co-Located AFM-Raman
• TERS Research
• Carbon Elemental Allotropes
• Materials Research