Innova-IRIS by Bruker Nano Surfaces and Metrology
Highest performance AFM-Raman system, now with Bruker's exclusive high-contrast IRIS TERS probes.
Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The ...
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